Title :
Noise measurements on NiFe/Ag multilayered structures
Author :
Lhermet, H. ; Cuchet, R. ; Vieux-Rochaz, L. ; Vaudaine, M.H.
Author_Institution :
LETI-CEA
Keywords :
Bridge circuits; Current density; Noise figure; Noise level; Noise measurement; Nonhomogeneous media; Size measurement; Voltage;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871829
