Title :
Simultaneous load-pull and real-time infrared thermal imaging of RF/microwave power transistors
Author :
Sevic, John F. ; Albright, Grant ; Schuerch, Wemer ; Simpson, Gary M.
Keywords :
Cameras; Electrical resistance measurement; Impedance; Infrared imaging; Microwave imaging; Optical imaging; Power transistors; Radio frequency; Temperature; Thermal loading;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387849
