Title :
On-wafer I/V measurement setup for the characterization of low-frequency dispersion in electron devices
Author :
Raffo, A. ; Santarelli, A. ; Traverso, P.A. ; Vannini, G. ; Filicori, F.
Keywords :
Current measurement; Cutoff frequency; Dispersion; Electron devices; FETs; Frequency measurement; Impedance; Predictive models; Pulse measurements; Voltage;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387850
