Title :
Comparing intemet-enabled VNA measurements with primary national standards
Author :
Morgan, Andrew G. ; Instone, Ian C. ; Ridler, Nick M. ; Thompson, Richard P.
Keywords :
Human computer interaction; Instruments; Joining processes; Laboratories; Manufacturing; Measurement standards; Measurement techniques; Measurement uncertainty; Metrology; Production facilities;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387851
