DocumentCode :
2458240
Title :
Correlations among sputter pressure, thickness, and coercivity in co/cu magnetic thin films sputfer-deposited on si[001]
Author :
Barnes, B.M. ; Kelly, J.J. ; MacKay, J.F. ; Mateeva, E. ; O´Brien, W.L. ; Lagally, M.G.
Author_Institution :
University of Wisconsin
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
69
Lastpage :
69
Keywords :
Artificial intelligence; Coercive force; Hysteresis; Magnetic films; Optical films; Performance evaluation; Pressure control; Rough surfaces; Surface roughness; Thickness control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.871849
Filename :
871849
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2458240
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