Title :
Network analyzer measurement de-embedding utilizing a distributed transmission matrix bisection of a single THRU structure
Author :
Daniel, Erik S. ; Harff, Nathan E. ; Sokolov, Vladimir ; Schreiber, Shaun M. ; Gilbert, Barry K.
Keywords :
Calibration; Dielectric measurements; Dielectric substrates; Distributed parameter circuits; Frequency measurement; Integrated circuit measurements; Integrated circuit technology; Space exploration; Transmission line matrix methods; Transmission line measurements;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387856
