DocumentCode
2458396
Title
Advanced technique for broadband on-wafer rf device characterization
Author
Scholz, Rene F. ; Korndörfer, Falk ; Senapati, Biswanath ; Rumiantsev, Andrej
fYear
2004
fDate
38149
Firstpage
83
Lastpage
90
Keywords
Calibration; Electrical resistance measurement; Measurement standards; Microprogramming; Q measurement; Radio frequency; Reflection; Scattering parameters; Semiconductor device modeling; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN
0-7803-8371-0
Type
conf
DOI
10.1109/ARFTG.2004.1387860
Filename
1387860
Link To Document