DocumentCode
2458413
Title
Evolution of thermal sensors in Intel processors from 90nm to 22nm
Author
Shor, Joseph ; Luria, Kosta
Author_Institution
Intel Yakum, Kibbutz Yakum, Israel
fYear
2012
fDate
14-17 Nov. 2012
Firstpage
1
Lastpage
5
Abstract
Thermal sensors are used in Intel processors in order to measure and regulate the chip´s temperature. This is useful to insure that the temperature does not exceed the reliability limit and also to optimize processor performance. Several sensors developed in Intel processes are reviewed and their evolution over different process generations is explained. The design tradeoffs and system requirements for these sensors are discussed.
Keywords
integrated circuit reliability; microprocessor chips; temperature measurement; temperature sensors; Intel processors; chip temperature measurement; chip temperature regulation; processor performance. optimize; reliability limit; thermal sensors evolution; CMOS integrated circuits; Probes; Program processors; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical & Electronics Engineers in Israel (IEEEI), 2012 IEEE 27th Convention of
Conference_Location
Eilat
Print_ISBN
978-1-4673-4682-5
Type
conf
DOI
10.1109/EEEI.2012.6377117
Filename
6377117
Link To Document