• DocumentCode
    2458470
  • Title

    Artificial neural network to statistically model the variation in small signal equivalent circuit model parameters for a Si/SiGe HBT process

  • Author

    Taber, H. ; Schreurs, D. ; Gillon, R. ; Vestiel, E. ; Alabadelah, A. ; van Niekerk, C. ; Nauwelaers, B.

  • fYear
    2004
  • fDate
    38149
  • Firstpage
    103
  • Lastpage
    106
  • Keywords
    Artificial neural networks; Distributed parameter circuits; Equivalent circuits; Germanium silicon alloys; Heterojunction bipolar transistors; Intelligent networks; Predictive models; Scattering parameters; Signal processing; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest Spring, 2004. 63rd
  • Print_ISBN
    0-7803-8371-0
  • Type

    conf

  • DOI
    10.1109/ARFTG.2004.1387863
  • Filename
    1387863
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2458470