Title :
A mechanically optimized stable and accurate on-wafer tuner setup
Author :
Tsironis, Christos ; Ducamp, Vincent ; Mallette, Vincent ; Meierer, Roman
Keywords :
Cables; Frequency; Impedance; Noise measurement; Probes; Size measurement; Testing; Tuners; Tuning; Velocity measurement;
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
DOI :
10.1109/ARFTG.2004.1387864
