DocumentCode :
2458733
Title :
Large-signal on-wafer characterization of RF conduction characteristics
Author :
Ladbrooke, P.H. ; Bridge, J.P. ; Goodship, N.
fYear :
2004
fDate :
38149
Firstpage :
183
Lastpage :
188
Keywords :
Distortion measurement; Microwave circuits; Microwave devices; Pulse measurements; Pulse shaping methods; Radio frequency; Scattering parameters; Semiconductor device measurement; Shape measurement; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN :
0-7803-8371-0
Type :
conf
DOI :
10.1109/ARFTG.2004.1387875
Filename :
1387875
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2458733
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