DocumentCode :
2459102
Title :
Difference of annealing effect of Co/Cu multilayers deposited on various kinds of underlayer
Author :
Nakagawa, S. ; Shimizu, Y. ; Saito, H. ; Naoe, M.
Author_Institution :
Tokyo Institute of Technology
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
118
Lastpage :
118
Keywords :
Annealing; Buffer layers; Conductivity; Crystallization; Degradation; Lattices; Nonhomogeneous media; Temperature dependence; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.871897
Filename :
871897
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2459102
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