Title :
Application of Acoustic Microscopy to Surface Profiling and Material Characterization
Author :
Liang, K. ; Kino, G.S. ; Khuri-Yakub, B.T.
Keywords :
Acoustic applications; Acoustic materials; Acoustic measurements; Acoustic reflection; Focusing; Fourier transforms; Microscopy; Reflectivity; Strips; Substrates;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198364