Title :
Subsurface Defect Detection Using Acoustic Microscopy
Author :
Khuri-Yakub, B.T. ; Reinholdtsen, P. ; Jun, K.S.
Keywords :
Acoustic applications; Acoustic beams; Acoustic materials; Acoustic signal detection; Acoustic transducers; Focusing; Microscopy; Optical reflection; RF signals; Surface impedance;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198365
