Title :
Side-Looking Acoustic Microscope for Interior Inspection of Holes
Author :
Addison, R.C. ; Elsley, R.K.
Keywords :
Acoustic beams; Acoustic signal detection; Acoustic transducers; Equations; Inspection; Microscopy; Piezoelectric transducers; Probes; Rough surfaces; Surface roughness;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198366