Title :
Effect of using Cr/Cr-Ti and Cr-Ti/Cr bilayered underlayers for Co-Cr-Ta recording layers
Author :
Nakagawa, S. ; Fukuda, T. ; Naoe, M.
Author_Institution :
Tokyo Institute of Technology
Keywords :
Chromium; Coercive force; Crystallization; Glass; Grain size; Magnetic films; Magnetic recording; Noise level; Saturation magnetization; Sputtering;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871915
