• DocumentCode
    2459503
  • Title

    Reliability Tests of a RFID-based Lock for Power Meter Applications

  • Author

    Chung, Kuan-Jung ; Jan, Chian-Wei ; Chen, Chih-Cheng ; Tsai, Sen-Chou

  • Author_Institution
    Dept. of Mechatron. Enginnering, Nat. Changhua Univ. of Educ., Changhua, Taiwan
  • fYear
    2012
  • fDate
    4-6 June 2012
  • Firstpage
    945
  • Lastpage
    948
  • Abstract
    A novel lock (seal), combined Radio Frequency Identification (RFID) techniques with a smart mechanism, has been developed to improve the anti-thief ability of the traditional mechanical lock (seal) and RFID-based one that we developed in previous work. The reliability validation tests present that RFID locks past all required test conditions including mechanical and environmental tests to demonstrate that RFID is suitable for the defined conditions in use. Furthermore, a thermal cycling test was performed to evaluate the Lifetimes of RFID-based locks. Norris-Landzberg accelerated life model is applied. The results show that the mean life of RFID locks is longer than the required 5 years, and there are 24 RFID locks to fail among 5 years when employing 1 million of them in the market.
  • Keywords
    metering; radiofrequency identification; reliability; Norris-Landzberg accelerated life model; RFID-based lock; environmental tests; mechanical tests; power meter applications; radio frequency identification technique; reliability tests; smart mechanism; thermal cycling test; Life estimation; Mathematical model; Radiofrequency identification; Reliability; Seals; Security; Stress; Radio Frequency Identification (RFID); accelerated life prediction; lock; reliability tests;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer, Consumer and Control (IS3C), 2012 International Symposium on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4673-0767-3
  • Type

    conf

  • DOI
    10.1109/IS3C.2012.246
  • Filename
    6228228