A study of the ESD sensitivity of bottom synthetic spin-valve recording head

Author

Lam, C.F. ; Barlow, I. ; Caleb Chang

Author_Institution

Read-Rite Corporation

fYear

2000

fDate

9-13 April 2000

Firstpage

145

Lastpage

145

Keywords

Degradation; Electrostatic discharge; Magnetic heads; Magnetic recording; Roentgenium; Signal to noise ratio; Testing; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International

Conference_Location

Toronto, ON, Canada

Print_ISBN

0-7803-5943-7

Type

DOI

10.1109/INTMAG.2000.871924

Filename

871924

Link To Document