Title :
A study of the ESD sensitivity of bottom synthetic spin-valve recording head
Author :
Lam, C.F. ; Barlow, I. ; Caleb Chang
Author_Institution :
Read-Rite Corporation
Keywords :
Degradation; Electrostatic discharge; Magnetic heads; Magnetic recording; Roentgenium; Signal to noise ratio; Testing; Threshold voltage;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871924
