Title :
Effect of film microstructure on exchange bias of irmn/cofe films
Author :
Pakala, M. ; Huai, Y. ; Anderson, G.
Author_Institution :
Read Rite Corporation
Keywords :
Annealing; Grain size; Helium; Lattices; Microstructure; Nonhomogeneous media; Shape; Temperature dependence; X-ray diffraction; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871926
