DocumentCode

2459622

Title

Effect of film microstructure on exchange bias of irmn/cofe films

Author

Pakala, M. ; Huai, Y. ; Anderson, G.

Author_Institution

Read Rite Corporation

fYear

2000

fDate

9-13 April 2000

Firstpage

147

Lastpage

147

Keywords

Annealing; Grain size; Helium; Lattices; Microstructure; Nonhomogeneous media; Shape; Temperature dependence; X-ray diffraction; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International

Conference_Location

Toronto, ON, Canada

Print_ISBN

0-7803-5943-7

Type

conf

DOI

10.1109/INTMAG.2000.871926

Filename

871926