Title :
MIMO Layer Shifting for LTE-Advanced Uplink
Author :
Park, Chester Sungchung ; Hammarwall, David ; Jöngren, George
Author_Institution :
Ericsson Res., San Jose, CA, USA
Abstract :
In this paper, multiple-input multiple-output (MIMO) layer shifting with cubic metric (CM) preserving precoder and downlink control signal sharing is proposed as a uplink transmission scheme for 3GPP Long Term Evolution (LTE). The design criteria for CM preserving precoder are presented and uplink precoder is designed accordingly. By sharing MCS (modulation and coding scheme) and/or HARQ (hybrid automatic repeat request) among codewords, downlink control signal sharing reduces the control signal overhead at the expense of performance degradation, which motivates this paper. The proposed MIMO layer shifting on a per SC-FDMA (single-carrier frequency division multiple access) symbol basis eliminates the discrepancy of channel quality among codewords, and thus improves the performance in the presence of MCS and/or HARQ sharing. Simulation results show that layer shifting is beneficial to both minimum mean square error (MMSE) and successive interference cancellation (SIC) receivers.
Keywords :
3G mobile communication; MIMO communication; automatic repeat request; frequency division multiple access; interference suppression; least mean squares methods; modulation coding; 3GPP Long Term Evolution; CM preserving precoder; HARQ; LTE-advanced uplink; MCS; MIMO layer shifting; MMSE receiver; SC-FDMA; SIC receiver; channel quality; cubic metric preserving precoder; downlink control signal sharing; hybrid automatic repeat request; minimum mean square error; modulation and coding scheme; multiple-input multiple-output layer shifting; single-carrier frequency division multiple access; successive interference cancellation; uplink precoder; uplink transmission scheme; Downlink; MIMO; Receivers; Signal to noise ratio; Silicon carbide; Throughput; Transmitting antennas;
Conference_Titel :
Vehicular Technology Conference Fall (VTC 2010-Fall), 2010 IEEE 72nd
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4244-3573-9
Electronic_ISBN :
1090-3038
DOI :
10.1109/VETECF.2010.5594247