Title : 
Statistical Approach to the Automation of Flaw Detection
         
        
            Author : 
Elsley, R.K. ; Fertig, K.W. ; Richardson, J.M. ; Cohen-Tenoudji, F.
         
        
        
        
        
        
            Keywords : 
Automation; Electric variables measurement; Force measurement; Inspection; Laboratories; Noise measurement; Scattering; Signal design; Testing; Ultrasonic variables measurement;
         
        
        
        
            Conference_Titel : 
IEEE 1984 Ultrasonics Symposium
         
        
            Conference_Location : 
Dallas, Texas, USA
         
        
        
            DOI : 
10.1109/ULTSYM.1984.198435