• DocumentCode
    2460715
  • Title

    Effects of phase-locked-loop circuit on a self-commutated BTB system under line faults

  • Author

    Pham, Phuong Viet ; Hagiwara, Makoto ; Akagi, Hirofumi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1708
  • Lastpage
    1714
  • Abstract
    A self-commutated BTB (back-to-back) system is an AC-DC-AC power flow controller between two utility grids, and PLL (phase-locked-loop) circuits are typically used for detecting their phase information. The performance of the BTB system during line faults is strongly affected by the dynamic behavior of the PLL circuit in terms of the AC-current fluctuation, the DC-voltage fluctuation, and the DC magnetic flux deviation in the converter-transformers. However, no paper or article has been discussed explicitly on their mutual relationship. The aim of this paper is to establish a design procedure of the PLL circuit which is suitable for the BTB system. This paper also deals with the DC magnetic flux deviation in the converter-transformers under double-line-to-ground (DLG) faults.
  • Keywords
    AC-DC power convertors; DC-AC power convertors; earthing; load flow control; magnetic flux; matrix algebra; phase locked loops; power grids; power system faults; power transformers; AC-DC-AC power flow controller; AC-current fluctuation; DC magnetic flux deviation; DC-voltage fluctuation; converter-transformers; double-line-to-ground faults; line faults; phase-locked-loop circuit; self-commutated back-to-back system; utility grids; Circuit faults; Fluctuations; Load flow control; Magnetic circuits; Magnetic flux; Phase detection; Phase locked loops; Power engineering and energy; Power system reliability; Voltage; BTB (Back-to-Back) systems; DLG fault; PLL (Phase-Locked-Loop) circuit; dc magnetic flux deviation; power flow control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
  • Conference_Location
    Rhodes
  • ISSN
    0275-9306
  • Print_ISBN
    978-1-4244-1667-7
  • Electronic_ISBN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.2008.4592188
  • Filename
    4592188