Title :
A New Method of Measuring Surface Layer-Thickness Using Dips in Angular Dependence of Reflection Coefficients
Author :
Tsukahara, Yusuke ; Takeuchi, Eiji ; Hayashi, Eisaku ; Tani, Yasuhiro
Keywords :
Acoustic measurements; Acoustic pulses; Electronics packaging; Frequency estimation; Gold; Mechanical variables measurement; Optical reflection; Surface acoustic waves; Thickness measurement; Time measurement;
Conference_Titel :
IEEE 1984 Ultrasonics Symposium
Conference_Location :
Dallas, Texas, USA
DOI :
10.1109/ULTSYM.1984.198453
