• DocumentCode
    2460797
  • Title

    Design of matrix converter topology and modulation algorithms with shorted and opened failure tolerance

  • Author

    Kwak, Sangshin ; Kim, Taehyung

  • Author_Institution
    Sch. of Electron. Eng., Daegu Univ., Daegu
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1734
  • Lastpage
    1740
  • Abstract
    This paper proposes a matrix converter structure and modulation techniques for fault-tolerant operations in case of single-switch short-circuit failures as well as single-switch open-circuit faults and single-phase open-circuit failures. The fault tolerant topology is achieved by redefining the matrix converter configuration with the help of auxiliary devices including connecting devices and fast-acting fuses. Based on the reconfigured converter structure, fault-tolerant control schemes are individually developed to produce output currents for obtaining continuous operation, depending on the types of occurred failures. The proposed fault-tolerant topology and associated pulsewidth modulation algorithms require only minimum hardware modifications to the conventional off-the-shelf three-phase matrix converter, by including electronic components such as triacs/SCRs and fast-acting fuses. In addition, the developed approach offers the potential of mitigating not only semiconductor device faults also drive related faults such as motor insulation failures. The added fault-tolerant capability can greatly improve reliability of the overall matrix converter system even after shorted switch or opened switch/phase losses, with minimal system cost increase. Simulation and experimental results are shown to demonstrate the feasibility of the proposed fault-tolerant scheme to the matrix converter drives.
  • Keywords
    PWM power convertors; failure analysis; fault tolerance; matrix convertors; variable speed drives; fault-tolerant control schemes; fault-tolerant operations; matrix converter drives; matrix converter topology; modulation algorithms; opened failure tolerance; pulsewidth modulation algorithms; single-phase open-circuit failures; single-switch open-circuit faults; single-switch short-circuit failures; Algorithm design and analysis; Circuit topology; Fault tolerance; Fuses; Hardware; Joining processes; Matrix converters; Pulse modulation; Pulse width modulation converters; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
  • Conference_Location
    Rhodes
  • ISSN
    0275-9306
  • Print_ISBN
    978-1-4244-1667-7
  • Electronic_ISBN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.2008.4592193
  • Filename
    4592193