DocumentCode :
2460866
Title :
Plasma density decay of vacuum discharges after current zero
Author :
Düning, G. ; Lindmayer, M.
Author_Institution :
Inst. fur Hochspannungstechnik und Elektrische Energieanlagen, Tech. Univ. Braunschweig, Germany
Volume :
2
fYear :
1998
fDate :
17-21 Aug 1998
Firstpage :
447
Abstract :
The knowledge of the physical processes around current zero and their modeling is important for the development of vacuum interrupters towards higher switching capacity and higher voltages. One essential feature is the recovery of the arc gap after current zero from the well-conducting state of the high-current plasma to the isolating state of the cold gap. Like in other switching media, there is still plasma present in the switching gap at current zero, which needs time to recombine and disappear. The presence of post-arc charge is associated with post-arc current under the influence of the transient recovery voltage, which in turn interacts with the surrounding network. As the charges carried by the post-arc current leave the gap, the post-arc current also influences the plasma decay. A simulation of this combined behavior needs an adequate mathematical post-arc model as well as the knowledge of data of the charge-carrier densities and their decay. It is the aim of this work to determine the necessary data, based on a simplified one-dimensional post-arc model, and to compare model calculations with experiments
Keywords :
circuit-breaking arcs; plasma density; switchgear testing; switching; vacuum arcs; vacuum breakdown; vacuum interrupters; arc gap recovery; charge-carrier densities; current zero; mathematical post-arc model; plasma decay simulation; plasma density decay; post-arc charge; post-arc current; switching capacity; switching media; transient recovery voltage; vacuum discharges; vacuum interrupters; Anodes; Cathodes; Charge carriers; Circuits; Current density; Plasma density; Plasma sheaths; Space charge; Vacuum arcs; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location :
Eindhoven
ISSN :
1093-2941
Print_ISBN :
0-7803-3953-3
Type :
conf
DOI :
10.1109/DEIV.1998.738630
Filename :
738630
Link To Document :
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