Title :
Image Registration Based on Log-Polar Transform and SIFT Features
Author :
Ding, Nannan ; Liu, Yanying ; Jin, Yongliang ; Zhu, Ming
Author_Institution :
Changchun Inst. of Opt., Fine Mech. & Phys., Chinese Acad. of Sci., Changchun, China
Abstract :
This paper describes a novel image registration method that combines log-polar transform and SIFT to recover similarity transformations (rotation/scale/translation). We extracts SIFT feature points in the two images firstly. Then, we use threshold Euclidean distance to coarsely match the feature points. After that, the log-polar transform is applied to compute the rotation and scale parameters. And we can obtain the translation parameter by the location relationship of the feature points.
Keywords :
feature extraction; image registration; transforms; SIFT feature extraction; image registration method; log polar transform; similarity transformation; Euclidean distance; Feature extraction; Image registration; Optics; Physics; Pixel; Transforms; SIFT; image registration; log-polar transform; threshold Euclidean distance;
Conference_Titel :
Computational and Information Sciences (ICCIS), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8814-8
Electronic_ISBN :
978-0-7695-4270-6
DOI :
10.1109/ICCIS.2010.186
