DocumentCode :
2461199
Title :
Component level corrosion resistance measurements on thin film media and its correlation to drive level tests
Author :
Jiaa, C.L.
Author_Institution :
Western Digital Corporation
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
233
Lastpage :
233
Keywords :
Corrosion; Drives; Electrical resistance measurement; Hydrogen; Information analysis; Optical films; Optical scattering; Surface resistance; Testing; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872011
Filename :
872011
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2461199
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