Title :
An Invariant Large Margin Nearest Neighbour Classifier
Author :
Kumar, M. Pawan ; Torr, P.H.S. ; Zisserman, A.
Author_Institution :
Oxford Brookes Univ., Oxford
Abstract :
The k-nearest neighbour (kNN) rule is a simple and effective method for multi-way classification that is much used in Computer Vision. However, its performance depends heavily on the distance metric being employed. The recently proposed large margin nearest neighbour (LMNN) classifier [21] learns a distance metric for kNN classification and thereby improves its accuracy. Learning involves optimizing a convex problem using semidefinite programming (SDP). We extend the LMNN framework to incorporate knowledge about invariance of the data. The main contributions of our work are three fold: (i) Invariances to multivariate polynomial transformations are incorporated without explicitly adding more training data during learning - these can approximate common transformations such as rotations and affinities; (ii) the incorporation of different regularizes on the parameters being learnt; and (Hi) for all these variations, we show that the distance metric can still be obtained by solving a convex SDP problem. We call the resulting formulation invariant LMNN (lLMNN) classifier. We test our approach to learn a metric for matching (i) feature vectors from the standard Iris dataset; and (ii) faces obtained from TV video (an episode of ´Buffy the Vampire Slayer´). We compare our method with the state of the art classifiers and demonstrate improvements.
Keywords :
computer vision; convex programming; image classification; object recognition; computer vision; feature vectors; invariant large margin nearest neighbour classifier; k-nearest neighbour rule; multivariate polynomial transformations; multiway classification; semidefinite programming; standard iris dataset; Computer vision; Face detection; Image recognition; Information retrieval; Iris; Object recognition; Polynomials; TV; Testing; Training data;
Conference_Titel :
Computer Vision, 2007. ICCV 2007. IEEE 11th International Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-1630-1
Electronic_ISBN :
1550-5499
DOI :
10.1109/ICCV.2007.4409041