مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2462128

Title :

Ballistic electron magnetic microscop

Author :

Buhrman, R.A. ; Rippard, W.H.

Author_Institution :

Cornell University

fYear :

2000

fDate :

9-13 April 2000

Firstpage :

285

Lastpage :

285

Keywords :

Electrons; High-resolution imaging; Magnetic field measurement; Magnetic films; Magnetic multilayers; Magnetic semiconductors; Magnetic separation; Micromagnetics; Semiconductor films; Thin film sensors;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International

Conference_Location :

Toronto, ON, Canada

Print_ISBN :

0-7803-5943-7

Type :

conf

DOI :

10.1109/INTMAG.2000.872061

Filename :

872061

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462128