DocumentCode
2462190
Title
Surface migration as a possible cause for late breakdowns [in vacuum interrupters]
Author
Jüttner, Burkhard
Author_Institution
Inst. of Phys., Humboldt-Univ., Berlin, Germany
Volume
2
fYear
1998
fDate
17-21 Aug 1998
Firstpage
488
Abstract
With a certain probability, in vacuum interrupters the recovery voltage leads to breakdown with a delay of many milliseconds or even seconds to current zero when the plasma or metal vapour has already completely disappeared. A conventional explanation of these late breakdowns are microparticles released by mechanical shocks from the electrodes or inner walls. The present paper reports on a model experiment. Metal vapour plasma is injected from a vacuum arc into a neighbouring high voltage gap where field electron emission is used as an indicator for the voltage strength. It has been found that this plasma enhances the field emission, thus reducing the voltage strength. The effect takes place some milliseconds up to several seconds after the plasma injection, and the time constants of the increase of the emission amount to 1-1000 ms. Mechanical shocks have similar effects and time constants. From this behaviour, it is concluded that surface migration with long time constants can influence the voltage strength of arced surfaces
Keywords
circuit-breaking arcs; electrodes; electron field emission; plasma; switchgear testing; vacuum arcs; vacuum breakdown; vacuum interrupters; 1 to 1000 ms; arced surfaces; breakdown delay; field electron emission; mechanical shocks; metal vapour plasma injection; microparticles; recovery voltage; surface migration; time constants; vacuum interrupters; voltage strength; Breakdown voltage; Delay; Electric breakdown; Electric shock; Electrodes; Electron emission; Interrupters; Plasmas; Vacuum arcs; Vacuum breakdown;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location
Eindhoven
ISSN
1093-2941
Print_ISBN
0-7803-3953-3
Type
conf
DOI
10.1109/DEIV.1998.738697
Filename
738697
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