DocumentCode :
2462271
Title :
Microscopic imaging of Fe magnetic domains exchange-coupled with those in a NiO
Author :
Matsuyama, H. ; Haginoya, C. ; Koike, K.
Author_Institution :
Hitachi Ltd.
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
292
Lastpage :
292
Keywords :
Antiferromagnetic materials; Atomic force microscopy; Atomic measurements; Iron; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetization; Scanning electron microscopy; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872068
Filename :
872068
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462271
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