DocumentCode
2462330
Title
Antiferromagnetic instabilities in exchange bias bilayers
Author
McMichael, R.D. ; Stiles, M.D. ; Lee, C.G. ; Chen, P.J. ; Egelhoff, W.F.
Author_Institution
National Institute of Standards and Technology
fYear
2000
fDate
9-13 April 2000
Firstpage
296
Lastpage
296
Keywords
Anisotropic magnetoresistance; Antiferromagnetic materials; Energy measurement; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetic resonance; Magnetization; Temperature dependence; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.872072
Filename
872072
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