DocumentCode
2462462
Title
Arc memory effect on postarc current in vacuum circuit breaker-simulation and experiment
Author
Weltmann, K.-D. ; Huber, E. ; Frohlich, K.
Author_Institution
ABB Corp. Res. Ltd., Baden-Daettwil, Switzerland
Volume
2
fYear
1998
fDate
17-21 Aug 1998
Firstpage
545
Abstract
Current and voltage measurements of the postarc period were carried out by means of industrial vacuum circuit breakers and a synthetic Well test circuit. The experimental results were used to determine the parameters of the sheath growth model described by J.G. Andrews and R.H. Harvey (1971). The initial ion density is fitted according to the current ramp di/dt before current zero (CZ) and according to the measured ∫i·dt during the arcing phase. Two different test procedures were applied in order to separate the effect of current ramp di/dt and ∫i·dt. The influence of both parameters and of the rate of rise of the recovery voltage (RRRV) on the sheath edge velocity could be demonstrated by simulation
Keywords
circuit-breaking arcs; electric current measurement; ion density; plasma sheaths; switchgear testing; vacuum circuit breakers; voltage measurement; arc memory effect; arcing phase; current measurement; current ramp di/dt; industrial vacuum circuit breakers; initial ion density; postarc current; recovery voltage rate of rise; sheath edge velocity; sheath growth model; synthetic Well test circuit; test procedures; vacuum circuit breaker; voltage measurement; Circuit breakers; Circuit simulation; Circuit testing; Current measurement; Density measurement; Laboratories; Plasma properties; Short circuit currents; Vacuum arcs; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location
Eindhoven
ISSN
1093-2941
Print_ISBN
0-7803-3953-3
Type
conf
DOI
10.1109/DEIV.1998.738710
Filename
738710
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