DocumentCode :
2462708
Title :
Scannng magnetoresistance microscope with a magnetoresistive sensor cantilever
Author :
Nakamura, M. ; Kimura, N. ; Sueoka, Kazuhisa ; Mukasa, K.
Author_Institution :
Hokkaido University
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
317
Lastpage :
317
Keywords :
Anisotropic magnetoresistance; Argon; Atomic force microscopy; Magnetic field measurement; Magnetic force microscopy; Magnetic sensors; Semiconductor thin films; Spin valves; Sputtering; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872092
Filename :
872092
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462708
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