DocumentCode :
2462717
Title :
Magnetic field imaging with a scanning ferromagnetic resonance probe
Author :
Lohndorf, M. ; Kabos, P. ; Moreland, J.
Author_Institution :
National Institute of Standards and Technology
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
318
Lastpage :
318
Keywords :
Atomic force microscopy; Magnetic field measurement; Magnetic fields; Magnetic films; Magnetic resonance; Magnetic resonance imaging; Magnetic sensors; Magnetization; Probes; Torque;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872093
Filename :
872093
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462717
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