DocumentCode :
2462778
Title :
Resolution enhancement by applying MFM under UHV condtions
Author :
Dreyer, M. ; Mayergoyz, I.D. ; Gomez, R.D.
Author_Institution :
Laboratory for Physical Sciences
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
322
Lastpage :
322
Keywords :
Atomic force microscopy; Force measurement; Frequency; Magnetic films; Magnetic force microscopy; Magnetic properties; Pollution measurement; Surface cleaning; Surface contamination; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872097
Filename :
872097
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462778
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