DocumentCode :
2462838
Title :
Characterization of cobalt nanowires by means of force microscopy
Author :
Garcia, J.M. ; Asenjo, A. ; Vazquez, M. ; Aranda, P. ; Ruiz-Hitzky, R.
Author_Institution :
Instituto de Magnetismo Aplicado
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
324
Lastpage :
324
Keywords :
Atomic force microscopy; Biomembranes; Cobalt; Magnetic analysis; Magnetic domains; Magnetic force microscopy; Magnetic materials; Magnetic properties; Nanowires; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872099
Filename :
872099
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2462838
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