• DocumentCode
    2463276
  • Title

    Recovering reflectance and illumination in a world of painted polyhedra

  • Author

    Sinha, Pawan ; Adelson, Edward

  • Author_Institution
    MIT, Cambridge, MA, USA
  • fYear
    1993
  • fDate
    11-14 May 1993
  • Firstpage
    156
  • Lastpage
    163
  • Abstract
    To be immune to variations in illumination, a vision system needs to be able to decompose images into their illumination and surface reflectance components. Most computational studies thus far have been concerned with strategies for solving the problem in the restricted domain of 2-D Mondrians. This domain has the simplifying characteristic of permitting discontinuities only in the reflectance distribution while the illumination distribution is constrained to vary smoothly. Such approaches prove inadequate in a 3-D world of painted polyhedra which allows for the existence of discontinuities in both the reflectance and illumination distributions. The authors propose a two-stage computational strategy for interpreting images acquired in such a domain. The first stage attempts to use simple local gray-level junction analysis to classify the observed image edges into the illumination or reflectance categories. Subsequent processing verifies the global consistency of these local inferences while also reasoning about the 3-D structure of the object and the illumination source direction
  • Keywords
    computer vision; image colour analysis; inference mechanisms; 2-D Mondrians; global consistency; illumination; illumination source direction; local gray-level junction analysis; local inferences; painted polyhedra; reasoning; reflectance distribution; reflectance recovery; surface reflectance components; two-stage computational strategy; vision system; Brain modeling; Cognitive science; Humans; Immune system; Laboratories; Layout; Lighting; Machine vision; Reflectivity; Visual system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 1993. Proceedings., Fourth International Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    0-8186-3870-2
  • Type

    conf

  • DOI
    10.1109/ICCV.1993.378224
  • Filename
    378224