DocumentCode :
2463383
Title :
Robust edge detection
Author :
Kundu, Amlan
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Buffalo, NY, USA
fYear :
1989
fDate :
4-8 Jun 1989
Firstpage :
11
Lastpage :
18
Abstract :
A robust edge-detection algorithm which performs equally under a wide variety of noisy situations and a broad range of edges is described. The algorithm is executed in three phases. In phase 1, the step and linear edges are detected from the noise-corrupted image using a statistical classification technique. In phase 2, all the thin-line edges (i.e. which are lines less than two pixels wide) are detected by a supplementary technique since these edges cannot be detected simultaneously with the other step and linear edges. In phase 3, the spurious edge elements are suppressed and the isolated missing edge elements are interpolated using a number of hypothesized edge-segments. Finally some experimental results are provided to illustrate the success of the algorithm
Keywords :
pattern recognition; picture processing; statistical analysis; edge detection; linear edges; noise-corrupted image; pattern recognition; picture processing; spurious edge; statistical classification; step edge; thin-line edges; Computational efficiency; Computer vision; Degradation; Gaussian noise; Image edge detection; Noise robustness; Phase detection; Phase noise; Signal to noise ratio; Smoothing methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
Conference_Location :
San Diego, CA
ISSN :
1063-6919
Print_ISBN :
0-8186-1952-x
Type :
conf
DOI :
10.1109/CVPR.1989.37823
Filename :
37823
Link To Document :
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