Title :
Modelling the Response of the Reflection Acoustic Microscope with Structural Variation in the Specimen
Keywords :
Acoustic beams; Acoustic imaging; Acoustic reflection; Image analysis; Integral equations; Microscopy; Optical reflection; Optical scattering; Performance analysis; Surface acoustic waves;
Conference_Titel :
IEEE 1985 Ultrasonics Symposium
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ULTSYM.1985.198607
