Title :
Substrate and process effects on thin Cr underlayer films
Author :
Youping Deng ; Lambeth, D.N. ; Laughlin, D.E.
Author_Institution :
Carnegie Mellon University
Keywords :
Chromium; Coercive force; Glass; Grain size; Optical films; Semiconductor films; Sputtering; Substrates; Voltage; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696588
