Title :
On Complexity-Reduced Implementation of Multi-Dimensional Wiener Interpolation Filtering
Author :
Li, Huijun ; Ibing, Andreas
Author_Institution :
Heinrich-Hertz-Inst., Fraunhofer Inst. for Telecommun., Berlin, Germany
Abstract :
The Wiener Interpolation Filter is commonly used to reconstruct a stochastic process from noisy samples. We focus on the case of a multi-dimensional stochastic process and the practical example of application of the filter for estimation of mobile radio propagation channels at a wireless receiver. We show that computational complexity of the implementation can be considerably reduced by exploiting two properties: first, multidimensional Wiener filtering is in general non-separable, while upsampling for interpolation is separable if the sample structure is a lattice - so it is beneficial to separate the two steps. Second, Wiener filtering can be implemented using spectral shaping of partially overlapping multidimensional blocks (fast convolution, overlap-add or overlap-save method). We discuss performance and complexity of the application to estimate the time-variant channel transfer function in OFDM (2D channel correlation) and MIMO-OFDM (3D channel correlation) transmission, for varying channel autocorrelation values (WSSUS model) and filter kernel sizes.
Keywords :
MIMO communication; OFDM modulation; Wiener filters; channel estimation; computational complexity; correlation methods; interpolation; mobile radio; multidimensional signal processing; radio receivers; stochastic processes; MIMO-OFDM transmission; complexity-reduced implementation; computational complexity; mobile radio propagation channels estimation; multidimensional Wiener interpolation filtering; multidimensional stochastic process; partially overlapping multidimensional blocks; spectral shaping; time-variant channel transfer function; varying channel autocorrelation values; wireless receiver; Channel estimation; Complexity theory; Convolution; Correlation; Interpolation; Kernel; OFDM;
Conference_Titel :
Vehicular Technology Conference Fall (VTC 2010-Fall), 2010 IEEE 72nd
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4244-3573-9
Electronic_ISBN :
1090-3038
DOI :
10.1109/VETECF.2010.5594450