• DocumentCode
    2464187
  • Title

    An iterative based feedforward-feedback control approach to high-speed AFM imaging

  • Author

    Wu, Ying ; Zou, Qingze

  • Author_Institution
    Mech. Eng. Dept., Iowa State Univ., Ames, IA, USA
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    1658
  • Lastpage
    1663
  • Abstract
    AFM imaging requires precision positioning of the AFM probe relative to the sample in all x-y-z axes, especially the vertical z-axis direction. Recently, the current-cycle-feedback iterative-learning-control (CCF-ILC) approach is proposed for high-speed AFM imaging. The CCF-ILC feedforward-feedback 2 degree-of-freedom (DOF) controller design has been successfully implemented for iteratively imaging on one scanline. In this article, we extend this CCF-ILC approach to the entire imaging of samples. The main contribution of this article is the analysis and the use of the CCF-ILC approach for tracking sample profiles with variations between scanlines (called line-to-line sample variations). The convergence (stability) of the CCF-ILC system is analyzed for the general case where the line-to-line sample variation occurs at each iteration. The allowable line-to-line sample profile variation is quantified. The performance improvement of the CCF-ILC is discussed by comparing the tracking error of the CCF-ILC technique to that of using feedback control alone. The proposed CCF-ILC control approach is illustrated by implementing it to the z-axis direction control in AFM imaging. Experimental results show that the imaging speed can be significantly increased by using the proposed approach.
  • Keywords
    adaptive control; atomic force microscopy; control system synthesis; feedback; feedforward; iterative methods; learning systems; position control; controller design; current-cycle-feedback approach; high-speed AFM imaging; imaging speed; iterative based feedforward-feedback control; iterative-learning-control approach; line-to-line sample variations; precision positioning; tracking error; z-axis direction control; Bandwidth; Control systems; Error correction; Feedback control; Iterative methods; Mechanical engineering; Probes; Robust control; Signal design; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5160092
  • Filename
    5160092