Title :
Supervised segmentation of textures in backscatter images
Author :
Paclik, P. ; Duin, Robert P W ; Van Kempen, Geert M P ; Kohlus, Reinhard
Author_Institution :
Fac. of Appl. Sci., Delft Univ. of Technol., Netherlands
Abstract :
In this paper we present an application of statistical pattern recognition for segmentation of backscatter images (BSE) in product analysis of laundry detergents. Currently, application experts segment BSE images interactively which is both time consuming and expert dependent. We present a new, automatic procedure for supervised BSE segmentation which is trained using additional multi-spectral EDX images. Each time a new feature selection procedure is employed to find a convenient feature subset for a particular segmentation problem. The performance of the presented algorithm is evaluated using ground-truth segmentation results. It is compared with that of interactive segmentation performed by the analyst.
Keywords :
image segmentation; pattern recognition; backscatter images segmentation; feature selection procedure; ground-truth segmentation; statistical pattern recognition; supervised texture segmentation; Backscatter; Chemical analysis; Image analysis; Image recognition; Image segmentation; Pattern analysis; Pattern recognition; Performance analysis; Powders; Scanning electron microscopy;
Conference_Titel :
Pattern Recognition, 2002. Proceedings. 16th International Conference on
Print_ISBN :
0-7695-1695-X
DOI :
10.1109/ICPR.2002.1048345