Supervised segmentation of textures in backscatter images

Author

Paclik, P. ; Duin, Robert P W ; Van Kempen, Geert M P ; Kohlus, Reinhard

Author_Institution

Fac. of Appl. Sci., Delft Univ. of Technol., Netherlands

Volume

2

fYear

2002

fDate

2002

Firstpage

490

Abstract

In this paper we present an application of statistical pattern recognition for segmentation of backscatter images (BSE) in product analysis of laundry detergents. Currently, application experts segment BSE images interactively which is both time consuming and expert dependent. We present a new, automatic procedure for supervised BSE segmentation which is trained using additional multi-spectral EDX images. Each time a new feature selection procedure is employed to find a convenient feature subset for a particular segmentation problem. The performance of the presented algorithm is evaluated using ground-truth segmentation results. It is compared with that of interactive segmentation performed by the analyst.

Keywords

image segmentation; pattern recognition; backscatter images segmentation; feature selection procedure; ground-truth segmentation; statistical pattern recognition; supervised texture segmentation; Backscatter; Chemical analysis; Image analysis; Image recognition; Image segmentation; Pattern analysis; Pattern recognition; Performance analysis; Powders; Scanning electron microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Pattern Recognition, 2002. Proceedings. 16th International Conference on

ISSN

1051-4651

Print_ISBN

0-7695-1695-X

Type

conf

DOI

10.1109/ICPR.2002.1048345

Filename

1048345