Title :
A cost minimization approach to edge detection using simulated annealing
Author :
Tan, H.L. ; Gelfand, S.B. ; Delp, E.J.
Author_Institution :
Comput. Vision & Image Process. Lab., Purdue Univ., West Lafayette, IN, USA
Abstract :
Edge detection is analyzed as a problem in cost minimization. A cost function is formulated that evaluates the quality of edge configurations. A mathematical description of edges is given, and the cost function is analyzed in terms of the characteristics of the edges in minimum-cost configurations. The cost function is minimized by the simulated annealing method. A novel set of strategies for generating candidate states and a suitable temperature schedule are presented. Sequential and parallel versions of the annealing algorithm are implemented and compared. Experimental results are presented
Keywords :
minimisation; pattern recognition; picture processing; candidate states; cost function; cost minimization; edge detection; optimisation; pattern recognition; picture processing; simulated annealing; temperature schedule; Cost function; IEL; Image edge detection; Image segmentation; Pixel; Simulated annealing; Tin;
Conference_Titel :
Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-8186-1952-x
DOI :
10.1109/CVPR.1989.37832
