DocumentCode :
2465671
Title :
Seed layer effects on the magnetoresistive properties of NiFe films
Author :
Gong, H. ; Litvinov, D. ; Klemmer, T.J. ; Lambeth, D.N. ; Howard, J.K.
Author_Institution :
Camegie Mellon University
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
473
Lastpage :
473
Keywords :
Conductivity; Electrical resistance measurement; Giant magnetoresistance; Goniometers; Magnetic films; Magnetic properties; Microstructure; Soft magnetic materials; Thickness measurement; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872248
Filename :
872248
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2465671
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