Title :
Algorithms for pattern rejection
Author :
Baker, Simon ; Nayar, Shree K.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Abstract :
The efficiency of pattern recognition is particularly crucial in two situations; whenever there are a large number of classes to discriminate, and, whenever recognition must be performed a large number of times. We develop a number of algorithms to cope with the demands of these difficult conditions. The algorithms achieve high efficiency by using pattern rejectors. A pattern rejector is a generalization of a classifier that quickly eliminates a large fraction of the candidate classes or inputs. After applying a rejector the recognition algorithms can concentrate their computational efforts on verifying the small number of remaining possibilities. The generality of our algorithms is established through a close relationship with the Karhunen-Loeve expansion. We experimented on two representative applications, namely, object recognition and feature detection. The results demonstrate substantial efficiency improvements over existing approaches, most notably Fisher´s discriminant analysis (1939)
Keywords :
pattern recognition; transforms; Karhunen-Loeve expansion; discriminant analysis; feature detection; object recognition; pattern recognition; pattern rejection; Algorithm design and analysis; Computer applications; Computer science; Computer vision; Detectors; Object detection; Object recognition; Pattern analysis; Pattern recognition; Pixel;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.547200