• DocumentCode
    2465792
  • Title

    Dielectric strength of triggered vacuum switches with six-gap electrode system

  • Author

    Sidorov, V.A. ; Alferov, Dmitry F.

  • Author_Institution
    All-Russian Electrotech. Inst., Moscow
  • Volume
    2
  • fYear
    1998
  • fDate
    17-21 Aug 1998
  • Firstpage
    788
  • Abstract
    Switching conditions influence on dielectric strength of internal insulation of high-current triggered vacuum switches with a trapezoidal rod electrode system is investigated. Investigations were carried out for two switching modes. In the first mode electrode erosion occurs mainly in a vapour phase when the electrode´s surface remains smooth enough after switching. In the other switching mode, drop phase of electrodes erosion prevailed and considerable electrode surface damage took place. It follows from experimental data statistical processing that breakdown voltage distribution is described satisfactorily with the Weibull distribution law. The influence of gap and electrode material on dielectric strength of triggered vacuum switches is considered
  • Keywords
    Weibull distribution; electric strength; electrodes; statistical analysis; vacuum switches; Weibull distribution law; breakdown voltage distribution; dielectric strength; drop phase; electrode erosion; electrode material; electrode surface damage; high-current triggered vacuum switches; internal insulation; six-gap electrode system; smooth electrode surface; statistical processing; switching conditions; trapezoidal rod electrode; triggered vacuum switches; vapour phase; Circuit testing; Copper; Dielectric breakdown; Dielectrics and electrical insulation; Electrodes; Switches; Vacuum arcs; Vacuum breakdown; Vacuum systems; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
  • Conference_Location
    Eindhoven
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-3953-3
  • Type

    conf

  • DOI
    10.1109/DEIV.1998.738889
  • Filename
    738889