DocumentCode
2465961
Title
Measurement of magnetostrictive tensor components using electronic speckle pattern interferometry (ESPI)
Author
Storch, M.L. ; Rollett, A.D. ; McHenry, M.E.
Author_Institution
Carnegie Mellon University
fYear
2000
fDate
9-13 April 2000
Firstpage
489
Lastpage
489
Keywords
Interferometry; Magnetic field induced strain; Magnetic materials; Magnetostriction; Materials science and technology; Nonlinear equations; Paints; Publishing; Speckle; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.872264
Filename
872264
Link To Document