• DocumentCode
    2466105
  • Title

    Assessment of novel phase change memory programming techniques

  • Author

    Liao, Yi-Bo ; Lin, Jun-Tin ; Chiang, Meng-Hsueh ; Hsu, Wei-Chou

  • Author_Institution
    Inst. of Microelectron., Nat. Cheng Kung Univ, Tainan
  • fYear
    2008
  • fDate
    8-10 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we present novel phase change memory programming techniques achieving low power operation without compromising performance by using proper pulsing schemes. By applying continuous current pulses at a fixed frequency or with the same pulse magnitude, binary data are successfully written into memory cells. The proposed programming techniques can be implemented with more flexible or simplified circuitry since a single current level is shown to be sufficient for write operations of both set and reset states.
  • Keywords
    phase change memories; programming; binary data; continuous current pulses; low power operation; memory cells; phase change memory programming; pulsing schemes; Amorphous materials; Crystalline materials; Crystallization; Energy consumption; Frequency; Nonvolatile memory; Phase change materials; Phase change memory; Resistance heating; Temperature; Phase change memory; non-volatile memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-2539-6
  • Electronic_ISBN
    978-1-4244-2540-2
  • Type

    conf

  • DOI
    10.1109/EDSSC.2008.4760662
  • Filename
    4760662